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Direct Dock Wafer Probing Interfaces
  Eagle ETS-364 Test Head Adapter
  Teradyne Catalyst Tower
  Credence ASL3000
  Teradyne J750

Choose from our large library of existing designs or build a custom interface for your probing needs  
The main goal of direct dock testing, where the ATE test head is directly mounted to the wafer prober, is to enable you to more thoroughly test an IC's functional performance.

inTEST direct-dock wafer probing interfaces give you the best of both worlds, combining the highest performance electrical interconnect components with the most dependable mechanical assemblies. We work closely with the major test and wafer prober manufacturers to design our products into their probing platforms, ensuring compatible form, fit, and function.

Whether your application is a dedicated test cell, or a cross-platform universal test set, our goal is to give you a test interface that is mechanically robust and electrically superior, for all types of devices. You can choose from a full range of designs that are optimized for high speed digital, memory, communications, high power, and true mixed signal devices. And inTEST interfaces can be adapted for both top and bottom loading probe card changeovers.


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