Product Index Careers News/Events SiteMap
inTEST Products Overview
Featured Product
Test Head Manipulators
Docking Products
Test Interface Products

Interface Products Overview

inTEST Silicon Valley

Centaur Modular Interface

Cabled Wafer Probing Interfaces
Direct Dock Wafer Probing Interfaces
Custom Wafer Probing Interfaces and Accessories

V-Touch™ Extended-Life Contactors™

Temptronic Thermal Test Solutions
Product Data Sheet Download

Process Monitoring Interface             < back to Cabled Wafer Probing Interface
  Process Monitoring Interface
  Universal Cabled Interface

Robust cable strain relief ensures long cable life.  
Top view of interface showing cable assemblies exiting the rear of probe interface.  
A variety of cable lengths are available for this process monitoring application.  
Operator’s view with interface open and ready to load probe card.  

If you need to bring your process monitoring to wafer level, this unique interface design does it all.

This top-loading interface is used with the PDF Real Vision test system, and is available from either inTEST or PDF.

Each one of its eight 72”-long* AMP cables transfers 66 individual contacts, giving you 32 force, 32 return, and 2 ground connections. When fully populated, the interface transfers 528 contacts from the tester to the 10”-diameter probe card.

Test verification boards are available in either 10-ohm, 100-ohm, or 100-Mohm configurations. The interface can be easily fitted with probe adapter rings so you can use the same tower on all your EG, Accretech, or TEL probe stations.

*120” cables are also available.

To top
© 2005 inTEST Corporation. All rights reserved. Privacy/Legal.
inTEST Corporation   804 East Gate Drive, Suite 200, Mount Laurel, NJ 08054   856-505-8800

Transpar Signal Modules Vertical Hinged Lock-Down Assembly Probe Card Tray Probe Adapter Ring (PAR) Centaur Modular Interface