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Process Monitoring Interface             < back to Cabled Wafer Probing Interface
 
  Process Monitoring Interface
  Universal Cabled Interface
 

Robust cable strain relief ensures long cable life.  
Top view of interface showing cable assemblies exiting the rear of probe interface.  
A variety of cable lengths are available for this process monitoring application.  
Operator’s view with interface open and ready to load probe card.  


If you need to bring your process monitoring to wafer level, this unique interface design does it all.

This top-loading interface is used with the PDF Real Vision test system, and is available from either inTEST or PDF.

Each one of its eight 72”-long* AMP cables transfers 66 individual contacts, giving you 32 force, 32 return, and 2 ground connections. When fully populated, the interface transfers 528 contacts from the tester to the 10”-diameter probe card.

Test verification boards are available in either 10-ohm, 100-ohm, or 100-Mohm configurations. The interface can be easily fitted with probe adapter rings so you can use the same tower on all your EG, Accretech, or TEL probe stations.

*120” cables are also available.



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