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Centaur Top Loading Applications and Configuration             < back to Centaur Modular Interface
 

New Centaur SOC 440
Components of the Centaur Modular Interface
  Centaur Top Loading Applications and Configurations
        Transpar Modules Overview | Transpar Modules Descriptions & Applications | Transpar Modules Specifications
  Centaur Bottom Loading Universal SOC Interface
        Example Applications of the Centaur SOC interface | Transpar Power and Signal Module Specifications
  Centaur Cabled Wafer Probing Interface

 

The Centaur Modular Interface features an extraordinarily wide range of configurations to fit your needs. The table below shows the maximum pin configurations by module type. (In this table, the Centaur is shown configured for use with a 7”, 10”, or 12” diameter probe card.)

 Probe Card Diameter 7” Probe Card 10” Probe Card 12” Probe Card
               
 Maximum Population Max. 8 Modules Max. 12 Modules
Max. 16 Modules
     
 Type “A” Transpar Module    
 71 Coax pins per module 568 852 1136
       
 Type “A/U” Transpar Module      
 64 Coax pins per module 512 384 512
 32 Utility pins per module 256 768 1024
       
 Type “C” Transpar Module      
 160 User defined pins per module 1280 1920 2560
       
               
 Type “C/U” Transpar Module  interface tower      
 64 Coax pins per module 1040 1560 2080
 32 Utility pins per module 256 384 512
       

Pin counts shown using single module type only. Actual configuration and pin count may vary.Module types may be combined as application requires Refer to Transpar data-sheet for detailed module specifications.


Transpar signal modules pin specifications:
  • Current rating per pin: 3 amps
  • Operating temperature range: -30oC to +150oC


Hand test adapter allows the probe tower to be used for testing packaged devices as well.  
 
Use Your Prober Interface on Your Tester!

The Centaur’s unique design (shown here with the optional Hand Test Adapter) lets you remove the tower assembly from the prober and lock it onto the PIB attached to the tester! Now you can hand-test package parts using your probing interface.


You’ll check correlation far more accurately because the tower is no longer a source of variation. You’re using the same tower at the prober and at the tester.




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